• X-ray inspection systems designed for high-resolution inspection requirements in electronics such as semiconductor packaging and circuit board assembly

■ Microme/X 

■ Microme/X DXR-HD 

■ Nanome/X 

■ Ndt/Analyser 

■ Pcba/Inspectc 

■ X/Argos 

■ Phoenix x/am 

■ Nanotom m

■ Nanotom s 

■ V/Tome/x L 240 

■ V/Tome/x L 300 

■ V/Tome/x L 450 

■ V/Tome/x s 

■ V/Tome/x n

■ Autonomously cooled and temperature-stabilized digital DXR flat panel detector with high dynamic response for real-time imaging

■ 180kV/20W high power submicron/nano X-ray tube with detail resolution up to 0.5 microns or 0.2 microns

■ x|act software programmable and automatic detection with CAD file import

■ Using diamond target, the speed of data interception can be 2 times faster under the same image quality

■ Optional 3D CT scanning function to achieve fast scanning in 10 seconds

■ geometric magnification 2000 times

■ total magnification 7000 times

■ detail resolution less than 1 μm