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X-ray Fluorescence Spectrometers

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?Material analysis of coatings and alloys (also thin coatings and low concentrations)

?Electronic Industry, ENIG , ENEPIG               

?Connectors and contacts

?PCB manufacturing thin gold (a few nanometers) and palladium coating measurement

?Trace element analysis; Determination of lead (Pb) for high reliability applications (avoid tin whiskers)

?Analysis of hard material coatings


XDAL237

■ DIN ISO 3497 and ASTM B 568 standards are used for automatic measurement of coatings up to 0.05μm and for material analysis of ppm levels

■ 3 different detectors are available (Si-PIN diode; SDD 20 mm squared; SDD 50 mm squared)

■ 3 kinds of switchable basic filter

■ Four kinds of switchable collimators, the minimum measuring point is about 0.15mm

■ Sample height up to 14cm, programmable XY bench, positioning accuracy of 10μm


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+86-10-6505-5534 (Beijing) +86-22-5883-5526 (Tianjin)
sankyo@northsankyo.com
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